Thiolate layers on metal sulfides characterised by XPS, ToF-SIMS and NEXAFS spectroscopy
Publication Type: Journal Articles (Refereed Article)
Year of Publication: 2008
Author(s): Goh, Siew Wei, Buckley, Alan N., Gong, Bill, Woods, Ronald, Lamb, Robert N., Fan, Liang-Jen, Yang, Yaw-wen
Back to top