Use of a GSR particle analysis program on an analytical sem to identify sources of emission of airborne particles.
| File | Size | Format | |
|---|---|---|---|
| 19379.pdf | 334Kb | Adobe PDF | View |
| Title | Use of a GSR particle analysis program on an analytical sem to identify sources of emission of airborne particles. |
|---|---|
| Author | Chan, Andrew; Bostrom, T.; Trumper, J. |
| Publication Title | ACM 17 : Australian conference on electron microscopy. |
| Editor | Australian society for electron microscopy |
| Year Published | 2002 |
| Publisher | Australian society for electron microscopy |
| Peer Reviewed | No |
| Published | Yes |
| Publisher URI | http://www.microscopy.org.au |
| Copyright Statement | Copyright 2002 Australian Society for Electron Microscopy. Reproduced in accordance with the copyright policy of the publisher. Use hypertext link to access the publisher's website. |
| Publication Type | Conference Publications (Extract Paper) |
Please use this identifier to cite this record: http://hdl.handle.net/10072/10141
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