Validation of a soil interface model to account for apparent aberrations in capacitive soil moisture sensors

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Title Validation of a soil interface model to account for apparent aberrations in capacitive soil moisture sensors
Author Johnson, Peter; Watling, Kym Marjorie; Thiel, David Victor; James, Daniel Arthur
Publication Title Proceedings of SPIE on CD-ROM: Microelectronics, MEMs and Nanotechnology
Editor Alex J. Hariz
Year Published 2006
Publisher SPIE (The International Society for Optical Engineering)
Peer Reviewed Yes
Published Yes
Publisher URI http://spiedl.aip.org/dbt/dbt.jsp?KEY=PSISDG&Volume=6035&Issue=1
Alternative URI http://dx.doi.org/10.1117/12.639118
Research Centre Centre for Wireless Monitoring and Applications
Faculty Faculty of Science, Environment, Engineering and Technology
Publication Type Conference Publications (Full Written Paper - Refereed)

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