The ability of static secondary ion mass spectrometry to discriminate submonolayer from multilayer adsorption of thiol collectors
There are no files associated with this record.
| Title | The ability of static secondary ion mass spectrometry to discriminate submonolayer from multilayer adsorption of thiol collectors |
|---|---|
| Author | Goh, Siew Wei; Buckley, Alan N.; Lamb, Robert N.; Woods, Ronald |
| Editor | Barry Wills |
| Year Published | 2006 |
| Publisher | Pergamon Press |
| Citation | Minerals Engineering, Vol. 19(6-8), pp. 571-581 |
| Peer Reviewed | Yes |
| Published | Yes |
| Faculty | Faculty of Science |
| Publication Type | Journal Articles (Refereed Article) |
Please use this identifier to cite this record: http://hdl.handle.net/10072/14296
Griffith University copyright notice
Copyright in individual works within the repository belongs to their authors or publishers. You may make a print or digital copy of a work for your personal non-commercial use. All other rights are reserved, except for fair dealings or other user rights granted by the copyright laws of your country.
Footer information
Back to top