Quantum Process Tomography of a Controlled-NOT Gate

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Title Quantum Process Tomography of a Controlled-NOT Gate
Author O'Brien, J. L.; Pryde, Geoff; Gilchrist, A.; James, D. F. V.; Langford, N. K.; Ralph, T. C.; White, A. G.
Journal Name Physical Review Letters
Year Published 2004
Place of publication Ridge, NY
Publisher American Physical Society
Abstract We demonstrate complete characterization of a two-qubit entangling process—a linear optics controlled-NOT gate operating with coincident detection—by quantum process tomography. We use a maximum-likelihood estimation to convert the experimental data into a physical process matrix. The process matrix allows an accurate prediction of the operation of the gate for arbitrary input states and a calculation of gate performance measures such as the average gate fidelity, average purity, and entangling capability of our gate, which are 0.90, 0.83, and 0.73, respectively.
Peer Reviewed Yes
Published Yes
Publisher URI http://prl.aps.org/
Alternative URI http://dx.doi.org/10.1103/PhysRevLett.93.080502
Copyright Statement Copyright 2004 American Physical Society. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the journal link for access to the definitive, published version.
Volume 93
Issue Number 8
Page from 080502-1
Page to 080502-4
ISSN 1079-7114
Date Accessioned 2006-06-23
Date Available 2009-09-24T05:53:29Z
Language en_AU
Research Centre Centre for Quantum Dynamics
Faculty Faculty of Science
Subject PRE2009-Physical Sciences; PRE2009-Quantum Optics and Lasers
URI http://hdl.handle.net/10072/15489
Publication Type Journal Articles (Refereed Article)
Publication Type Code c1x

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