Measuring two-qubit gates

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Title Measuring two-qubit gates
Author White, Andrew G.; Gilchrist, Alexei; Pryde, Geoff; O'Brien, Jeremy L.; Bremner, Michael J.; Langford, Nathan K.
Journal Name Journal of the Optical Society of America B: Optical Physics
Year Published 2007
Place of publication United States
Publisher Optical Society of America
Abstract Accurate characterization of two-qubit gates will be critical for any realization of quantum computation. We discuss a range of measurements for characterizing two-qubit gates. These measures are architectureindependent and span a range of complexity from simple measurement routines to full quantum-state and process tomography. Simple indicative measures, which flag but do not quantify gate operation in the quantum regime, include the fringe visibility, parity, Bell-state fidelity, and entanglement witnesses. Quantitative measures of gate output states include linear entropy and tangle; measures of, and error bounds to, whole-gate operation are provided by metrics such as process fidelity, process distance, and average gate fidelity. We discuss which measures are appropriate, given the stage of development of the gate, and highlight connections between them.
Peer Reviewed Yes
Published Yes
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Copyright Statement This paper was published in Journal of the Optical Society of America B: Optical Physics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Volume 24
Issue Number 2
Page from 172
Page to 183
ISSN 0740-3224
Date Accessioned 2007-05-21
Language en_US
Research Centre Centre for Quantum Dynamics
Faculty Faculty of Science, Environment, Engineering and Technology
Subject PRE2009-Physical Sciences; PRE2009-Quantum Optics and Lasers
Publication Type Journal Articles (Refereed Article)
Publication Type Code c1

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