Effects of Processing Fluctuations on a 0.1µ MOSFET

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Title Effects of Processing Fluctuations on a 0.1µ MOSFET
Author Rowlands, David Duanne; Dimitrijev, Sima
Publication Title 1995 IEEE TENCON IEEE Region 10 International Conference on Microelectronics and VLSI
Editor IEEE Hong Kong Section & IEEE Asia-Pacific Region
Year Published 1995
Publisher IEEE
Peer Reviewed No
Published Yes
Publisher URI http://www.ieee.org/portal/site
Alternative URI http://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=10682&isYear=1995
Copyright Statement Copyright 1995 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Publication Type Full written Paper - Non-refereed Proceedings

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