Simulation of interface states effect on the scanning capacitance microscopy measurement of p–n junctions

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Title Simulation of interface states effect on the scanning capacitance microscopy measurement of p–n junctions
Author Yang, J.; Kong, Frederick Chung Jeng
Year Published 2002
Publisher American Institute of Physics
Citation Applied Physics Letters, Vol. 81(26), pp. 4973-4975
Peer Reviewed Yes
Published Yes
Publisher URI http://apl.aip.org/
Alternative URI http://dx.doi.org/10.1063/1.1532547
Faculty Faculty of Engineering and Information Technology
Publication Type Journal Articles (Refereed Article)

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