An automated submicron beam profiler for characterization of high numerical aperture optics
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| Title | An automated submicron beam profiler for characterization of high numerical aperture optics |
|---|---|
| Author | Chapman, Justin; Norton, Benjamin Geoffrey; Streed, Erik; Kielpinski, David |
| Year Published | 2008 |
| Publisher | American Institute of Physics |
| Citation | Review of Scientific Instruments, Vol. 79, pp. 095106-1-095106-4 |
| Peer Reviewed | Yes |
| Published | Yes |
| Alternative URI | http://dx.doi.org/10.1063/1.2991112 |
| Research Centre | Centre for Quantum Dynamics |
| Faculty | Faculty of Science, Environment, Engineering and Technology |
| Publication Type | Journal Articles (Refereed Article) |
Please use this identifier to cite this record: http://hdl.handle.net/10072/23491
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