An automated submicron beam profiler for characterization of high numerical aperture optics

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Title An automated submicron beam profiler for characterization of high numerical aperture optics
Author Chapman, Justin; Norton, Benjamin Geoffrey; Streed, Erik; Kielpinski, David
Year Published 2008
Publisher American Institute of Physics
Citation Review of Scientific Instruments, Vol. 79, pp. 095106-1-095106-4
Peer Reviewed Yes
Published Yes
Alternative URI http://dx.doi.org/10.1063/1.2991112
Research Centre Centre for Quantum Dynamics; Institute for Glycomics
Faculty Faculty of Science, Environment, Engineering and Technology
Publication Type Journal Articles (Refereed Article)

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