An automated submicron beam profiler for characterization of high numerical aperture optics

There are no files associated with this record.

Title An automated submicron beam profiler for characterization of high numerical aperture optics
Author Chapman, Justin; Norton, Benjamin Geoffrey; Streed, Erik; Kielpinski, David
Journal Name Review of Scientific Instruments
Year Published 2008
Place of publication Melville, NY
Publisher American Institute of Physics
Peer Reviewed Yes
Published Yes
Alternative URI http://dx.doi.org/10.1063/1.2991112
Volume 79
Page from 095106-1
Page to 095106-4
ISSN 0034-6748
Date Accessioned 2009-03-25
Date Available 2011-11-22T04:14:07Z
Language en_AU
Research Centre Centre for Quantum Dynamics; Institute for Glycomics
Faculty Faculty of Science, Environment, Engineering and Technology
URI http://hdl.handle.net/10072/23491
Publication Type Journal Articles (Refereed Article)
Publication Type Code c1

Show simple item record

Griffith University copyright notice