An automated submicron beam profiler for characterization of high numerical aperture optics
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| Title | An automated submicron beam profiler for characterization of high numerical aperture optics |
|---|---|
| Author | Chapman, Justin; Norton, Benjamin Geoffrey; Streed, Erik; Kielpinski, David |
| Journal Name | Review of Scientific Instruments |
| Year Published | 2008 |
| Place of publication | Melville, NY |
| Publisher | American Institute of Physics |
| Peer Reviewed | Yes |
| Published | Yes |
| Alternative URI | http://dx.doi.org/10.1063/1.2991112 |
| Volume | 79 |
| Page from | 095106-1 |
| Page to | 095106-4 |
| ISSN | 0034-6748 |
| Date Accessioned | 2009-03-25 |
| Date Available | 2011-11-22T04:14:07Z |
| Language | en_AU |
| Research Centre | Centre for Quantum Dynamics |
| Faculty | Faculty of Science, Environment, Engineering and Technology |
| URI | http://hdl.handle.net/10072/23491 |
| Publication Type | Journal Articles (Refereed Article) |
| Publication Type Code | c1 |
Please use this identifier to cite this record: http://hdl.handle.net/10072/23491
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