X-ray photoelectron spectra of high Tc bismuth compounds : General trends for layer structures
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| Title | X-ray photoelectron spectra of high Tc bismuth compounds : General trends for layer structures |
|---|---|
| Author | Bocquet, Antoine; Dobson, John Francis; Healy, Peter Conrad; Myhra, Sverre; Thompson, J. G. |
| Year Published | 1989 |
| Publisher | Wiley V C H |
| Citation | Physica Status Solidi B: Basic Research, Vol. 152, pp. 519-532 |
| Peer Reviewed | Yes |
| Published | Yes |
| Publisher URI | http://www3.interscience.wiley.com/journal/40001185/home |
| Alternative URI | http://dx.doi.org/10.1002/pssb.2221520214 |
| Copyright Statement | Copyright 1989 John Wiley & Sons, Ltd. Self-archiving of the author-manuscript version is not yet supported by this publisher. Please refer to the journal link for access to the definitive, published version or contact the author for more information. |
| Research Centre | Queensland Micro and Nanotechnology Centre |
| Faculty | Faculty of Science |
| Publication Type | Journal Articles (Refereed Article) |
Please use this identifier to cite this record: http://hdl.handle.net/10072/25038
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