Optimizing piezo-resistive strain gauge characteristics for intelligent strain sensing applications
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| Title | Optimizing piezo-resistive strain gauge characteristics for intelligent strain sensing applications |
|---|---|
| Author | Macnamara, Dwain Seton; Thiel, David Victor; James, Daniel Arthur; Lisner, Peter Charles |
| Publication Title | SPIE International Symposium on Microelectronics, MEMs and Nanotechnology |
| Editor | Alex J. Hariz |
| Year Published | 2005 |
| Publisher | SPIE |
| Peer Reviewed | Yes |
| Published | Yes |
| Publisher URI | http://spiedl.aip.org/dbt/dbt.jsp?KEY=PSISDG&Volume=6035&Issue=1 |
| Alternative URI | http://dx.doi.org/10.1117/12.650131 |
| Research Centre | Centre for Wireless Monitoring and Applications |
| Faculty | Faculty of Engineering and Information Technology |
| Publication Type | Conference Publications (Full Written Paper - Refereed) |
Please use this identifier to cite this record: http://hdl.handle.net/10072/2619
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