Optimizing piezo-resistive strain gauge characteristics for intelligent strain sensing applications

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Title Optimizing piezo-resistive strain gauge characteristics for intelligent strain sensing applications
Author Macnamara, Dwain Seton; Thiel, David Victor; James, Daniel Arthur; Lisner, Peter Charles
Publication Title SPIE International Symposium on Microelectronics, MEMs and Nanotechnology
Editor Alex J. Hariz
Year Published 2005
Publisher SPIE
Peer Reviewed Yes
Published Yes
Publisher URI http://spiedl.aip.org/dbt/dbt.jsp?KEY=PSISDG&Volume=6035&Issue=1
Alternative URI http://dx.doi.org/10.1117/12.650131
Research Centre Centre for Wireless Monitoring and Applications
Faculty Faculty of Engineering and Information Technology
Publication Type Conference Publications (Full Written Paper - Refereed)

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