Thiolate layers on metal sulfides characterised by XPS, ToF-SIMS and NEXAFS spectroscopy

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Title Thiolate layers on metal sulfides characterised by XPS, ToF-SIMS and NEXAFS spectroscopy
Author Goh, Siew Wei; Buckley, Alan N.; Gong, Bill; Woods, Ronald; Lamb, Robert N.; Fan, Liang-Jen; Yang, Yaw-wen
Year Published 2008
Publisher Elsevier
Citation Minerals Engineering, Vol. 21(12-14), pp. 1026-1037
Peer Reviewed Yes
Published Yes
Publisher URI http://www.sciencedirect.com/science/journal/08926875
Alternative URI http://dx.doi.org/10.1016/j.mineng.2008.03.014
Faculty Faculty of Science, Environment, Engineering and Technology
Publication Type Journal Articles (Refereed Article)

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