Global Features for the Off-Line Signature Verification Problem

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Title Global Features for the Off-Line Signature Verification Problem
Author Nguyen, Vu Minh; Blumenstein, Michael Myer; Leedham, Graham
Publication Title Proceedings of the 10th International Conference on Document Analysis annd Recognition
Editor Bob Werner
Year Published 2009
Publisher IEEE Computer Society
Peer Reviewed Yes
Published Yes
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Copyright Statement Copyright 2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Research Centre Institute for Integrated and Intelligent Systems
Faculty Faculty of Science, Environment, Engineering and Technology
Publication Type Conference Publications (Full Written Paper - Refereed)

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