General Optimality of the Heisenberg Limit for Quantum Metrology

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Title General Optimality of the Heisenberg Limit for Quantum Metrology
Author Zwierz, Marcin; Pe´rez-Delgado, Carlos A.; Kok, Pieter
Journal Name Physical Review Letters
Year Published 2010
Place of publication United States
Publisher American Physical Society
Abstract Quantum metrology promises improved sensitivity in parameter estimation over classical procedures. However, there is a debate over the question of how the sensitivity scales with the resources and the number of queries that are used in estimation procedures. Here, we reconcile the physical definition of the relevant resources used in parameter estimation with the information-theoretical scaling in terms of the query complexity of a quantum network. This leads to a completely general optimality proof of the Heisenberg limit for quantum metrology. We give an example of how our proof resolves paradoxes that suggest sensitivities beyond the Heisenberg limit, and we show that the Heisenberg limit is an information-theoretic interpretation of the Margolus-Levitin bound, rather than Heisenberg’s uncertainty relation.
Peer Reviewed Yes
Published Yes
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Copyright Statement Copyright 2010 American Physical Society. This is the author-manuscript version of this paper. Reproduced in accordance with the copyright policy of the publisher. Please refer to the journal's website for access to the definitive, published version.
Volume 105
Issue Number 18
Page from 180402-1
Page to 180402-4
ISSN 0031-9007
Date Accessioned 2011-11-23
Language en_US
Faculty Faculty of Science, Environment, Engineering and Technology
Subject Quantum Information, Computation and Communication; Quantum Optics; Quantum Physics
Publication Type Journal Articles (Refereed Article)
Publication Type Code c1x

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