Study on the BeiHang Keystroke Dynamics Database

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Title Study on the BeiHang Keystroke Dynamics Database
Author Li, Yilin; Zhang, Baochang; Cao, Yao; Zhao, Sanqiang; Gao, Yongsheng; Liu, Jianzhuang
Publication Title Proceedings of the 2011 International Joint Conference on Biometrics (IJCB 2011)
Editor K. W. Bowyer, R. Chellappa
Year Published 2011
Place of publication United States
Publisher IEEE Computer Society
Abstract This paper introduces a new BeiHang (BH) Keystroke Dynamics Database for testing and evaluation of biometric approaches. Different from the existing keystroke dynamics researches which solely rely on laboratory experiments, the developed database is collected from a real commercialized system and thus is more comprehensive and more faithful to human behavior. Moreover, our database comes with ready-to-use benchmark results of three keystroke dynamics methods, Nearest Neighbor classifier, Gaussian Model and One-Class Support Vector Machine. Both the database and benchmark results are open to the public and provide a significant experimental platform for international researchers in the keystroke dynamics area.
Peer Reviewed Yes
Published Yes
Alternative URI http://dx.doi.org/10.1109/IJCB.2011.6117485
Copyright Statement Copyright 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
ISBN 978-1-4577-1358-3
Conference name 2011 International Joint Conference on Biometrics (IJCB 2011)
Location Washington, DC, United States
Date From 2011-10-10
Date To 2011-10-13
URI http://hdl.handle.net/10072/43574
Date Accessioned 2012-02-10
Language en_US
Research Centre Institute for Integrated and Intelligent Systems
Faculty Faculty of Science, Environment, Engineering and Technology
Subject Computer Vision; Pattern Recognition and Data Mining
Publication Type Conference Publications (Full Written Paper - Refereed)
Publication Type Code e1

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